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| 2007 | ||
|---|---|---|
| 1 | EE | Daniel Mazor, Michael L. Bushnell, David J. Mulligan, Richard J. Blaikie: Fault Models and Device Yield of a Large Population of Room Temperature Operation Single-Electron Transistors. VLSI Design 2007: 657-664 |
| 1 | Richard J. Blaikie | [1] |
| 2 | Michael L. Bushnell | [1] |
| 3 | David J. Mulligan | [1] |