2007 | ||
---|---|---|
2 | EE | Daniel Mazor, Michael L. Bushnell, David J. Mulligan, Richard J. Blaikie: Fault Models and Device Yield of a Large Population of Room Temperature Operation Single-Electron Transistors. VLSI Design 2007: 657-664 |
2002 | ||
1 | EE | Richard J. Blaikie, Maan M. Alkaisi, Steven M. Durbin, David R. S. Cumming: Teaching Integrated Circuit and Semiconductor Device Design in New Zealand: The University of Canterbury Approach. DELTA 2002: 223-229 |
1 | Maan M. Alkaisi | [1] |
2 | Michael L. Bushnell | [2] |
3 | David R. S. Cumming | [1] |
4 | Steven M. Durbin | [1] |
5 | Daniel Mazor | [2] |
6 | David J. Mulligan | [2] |