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Benjamin M. Mauck

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2004
1EEBenjamin M. Mauck, Vishnumohan Ravichandran, Usman Azeez Mughal: A Design for Test Technique for Parametric Analysis of SRAM: On-Die Low Yield Analysis. ITC 2004: 105-113

Coauthor Index

1Usman Azeez Mughal [1]
2Vishnumohan Ravichandran [1]

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