Farid Matta
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1988
1
Brian Leslie
, Farid Matta: Membrane Probe Card Technology (the Future for High Performance Wafer Test).
ITC 1988
: 601-607
Coauthor
Index
1
Brian Leslie
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
