V. Manevych
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2006
1
EE
G. Golan
,
A. Axelevitch
,
B. Gorenstein
, V. Manevych: Hot-Probe method for evaluation of impurities concentration in semiconductors.
Microelectronics Journal 37
(9): 910-915 (2006)
Coauthor
Index
1
A. Axelevitch
[
1
]
2
G. Golan
[
1
]
3
B. Gorenstein
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
