P. Lyonnet
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2008
1
EE
R. Toscano
, P. Lyonnet: On-Line Reliability Prediction via Dynamic Failure Rate Model.
IEEE Transactions on Reliability 57
(3): 452-457 (2008)
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1
R. Toscano
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
