| |
| 2007 | ||
|---|---|---|
| 1 | EE | S.-P. Lin, C.-L. Lee, J.-E. Chen, J.-J. Chen, K.-L. Luo, W.-C. Wu: A Multilayer Data Copy Test Data Compression Scheme for Reducing Shifting-in Power for Multiple Scan Design. IEEE Trans. VLSI Syst. 15(7): 767-776 (2007) |
| 1 | J.-E. Chen | [1] |
| 2 | J.-J. Chen | [1] |
| 3 | C.-L. Lee | [1] |
| 4 | S.-P. Lin | [1] |
| 5 | W.-C. Wu | [1] |