S.-P. Lin

2007
1	EE	S.-P. Lin, C.-L. Lee, J.-E. Chen, J.-J. Chen, K.-L. Luo, W.-C. Wu: A Multilayer Data Copy Test Data Compression Scheme for Reducing Shifting-in Power for Multiple Scan Design. IEEE Trans. VLSI Syst. 15(7): 767-776 (2007)

Coauthor Index

1	J.-E. Chen	[1]
2	J.-J. Chen	[1]
3	C.-L. Lee	[1]
4	K.-L. Luo	[1]
5	W.-C. Wu	[1]