T. R. Lundquist
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2003
1
EE
Hervé Deslandes
, T. R. Lundquist: Limitations to photon-emission microscopy when applied to "hot" devices.
Microelectronics Reliability 43
(9-11): 1645-1650 (2003)
Coauthor
Index
1
Hervé Deslandes
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
