Jonathan Lueke
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2005
1
EE
Jonathan Lueke,
Noor Al Quddus
,
Walied A. Moussa
,
Aman Chahal
: A Parametric Study of Thermal Effects on the Reliability of RF MEMS Switches.
ICMENS 2005
: 30-31
Coauthor
Index
1
Aman Chahal
[
1
]
2
Walied A. Moussa
[
1
]
3
Noor Al Quddus
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
