| |
| 2000 | ||
|---|---|---|
| 2 | EE | L. Ludwig, Elena P. Sapozhnikova, V. P. Lunin, Wolfgang Rosenstiel: Error Classification and Yield Prediction of Chips in Semiconductor Industry Applications. Neural Computing and Applications 9(3): 202-210 (2000) |
| 1999 | ||
| 1 | EE | Elena P. Sapozhnikova, V. P. Lunin, L. Ludwig, Wolfgang Rosenstiel: The use of dARTMAP and fuzzy ARTMAP to solve the quality testing task in semiconductor industry. KES 1999: 361-364 |
| 1 | V. P. Lunin | [1] [2] |
| 2 | Wolfgang Rosenstiel | [1] [2] |
| 3 | Elena P. Sapozhnikova | [1] [2] |