C.-K. Low
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2004
1
EE
U. Balasooriya
, C.-K. Low: Competing causes of failure and reliability tests for Weibull lifetimes under type I progressive censoring.
IEEE Transactions on Reliability 53
(1): 29-36 (2004)
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1
U. Balasooriya
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)