U. Balasooriya

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2004

1 EE U. Balasooriya, C.-K. Low: Competing causes of failure and reliability tests for Weibull lifetimes under type I progressive censoring. IEEE Transactions on Reliability 53(1): 29-36 (2004)

2004
1	EE	U. Balasooriya, C.-K. Low: Competing causes of failure and reliability tests for Weibull lifetimes under type I progressive censoring. IEEE Transactions on Reliability 53(1): 29-36 (2004)

Coauthor Index

1 C.-K. Low [1]