V. Loukusa
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2006
1
EE
V. Loukusa: Embedded System Level Self-Test for Mixed-Signal IO Verification.
J. Electronic Testing 22
(4-6): 463-470 (2006)
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)