2009 |
12 | EE | Chris Lokan,
Emilia Mendes:
Using Chronological Splitting to Compare Cross- and Single-company Effort Models: Further Investigation.
ACSC 2009: 35-42 |
2008 |
11 | EE | Hai Huong Dam,
Pornthep Rojanavasu,
Hussein A. Abbass,
Chris Lokan:
Distributed Learning Classifier Systems.
Learning Classifier Systems in Data Mining 2008: 69-91 |
10 | EE | Emilia Mendes,
Chris Lokan:
Replicating studies on cross- vs single-company effort models using the ISBSG Database.
Empirical Software Engineering 13(1): 3-37 (2008) |
9 | EE | Hai Huong Dam,
Hussein A. Abbass,
Chris Lokan,
Xin Yao:
Neural-Based Learning Classifier Systems.
IEEE Trans. Knowl. Data Eng. 20(1): 26-39 (2008) |
2007 |
8 | EE | Abu S. S. M. Barkat Ullah,
Ruhul A. Sarker,
David Cornforth,
Chris Lokan:
An agent-based memetic algorithm (AMA) for solving constrained optimazation problems.
IEEE Congress on Evolutionary Computation 2007: 999-1006 |
7 | EE | Hai Huong Dam,
Chris Lokan,
Hussein A. Abbass:
Evolutionary Online Data Mining: An Investigation in a Dynamic Environment.
Evolutionary Computation in Dynamic and Uncertain Environments 2007: 153-178 |
2006 |
6 | EE | Chris Lokan,
Emilia Mendes:
Cross-company and single-company effort models using the ISBSG database: a further replicated study.
ISESE 2006: 75-84 |
2005 |
5 | EE | Hai Huong Dam,
Hussein A. Abbass,
Chris Lokan:
The performance of the DXCS system on continuous-valued inputs in stationary and dynamic environments.
Congress on Evolutionary Computation 2005: 618-625 |
4 | EE | Hai Huong Dam,
Hussein A. Abbass,
Chris Lokan:
DXCS: an XCS system for distributed data mining.
GECCO 2005: 1883-1890 |
3 | EE | Hai Huong Dam,
Hussein A. Abbass,
Chris Lokan:
Be real! XCS with continuous-valued inputs.
GECCO Workshops 2005: 85-87 |
2 | EE | Chris Lokan:
What Should You Optimize When Building an Estimation Model?.
IEEE METRICS 2005: 34 |
1 | EE | Emilia Mendes,
Chris Lokan,
Robert Harrison,
Chris Triggs:
A Replicated Comparison of Cross-Company and Within-Company Effort Estimation Models Using the ISBSG Database.
IEEE METRICS 2005: 36 |