2002 | ||
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1 | EE | Mohandass Sivakumar, Vaidyanathan Kripesh, Chong Ser Choong, Chai Tai Chong, Loon Aik Lim: Reliability of Wire Bonding on Low-k Dielectric Material in Damascene Copper Integrated Circuits PBGA Assembly. Microelectronics Reliability 42(9-11): 1535-1540 (2002) |
1 | Chai Tai Chong | [1] |
2 | Chong Ser Choong | [1] |
3 | Vaidyanathan Kripesh | [1] |
4 | Mohandass Sivakumar | [1] |