Chenhsin Lien
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2004
1
EE
Chun-Hsing Shih
,
Yi-Min Chen
, Chenhsin Lien: Design strategy of localized halo profile for achieving sub-50 nm bulk MOSFET.
Microelectronics Reliability 44
(7): 1069-1075 (2004)
Coauthor
Index
1
Yi-Min Chen
[
1
]
2
Chun-Hsing Shih
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
