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Adam W. Ley

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1999
2 Adam W. Ley: The integration of boundary-scan test methods to a mixed-signal environment. ITC 1999: 159-162
1EEMike Wondolowski, Ben Bennetts, Adam W. Ley: Boundary Scan: The Internet of Test. IEEE Design & Test of Computers 16(3): 34-43 (1999)

Coauthor Index

1Ben Bennetts (R. G. Bennetts) [1]
2Mike Wondolowski [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)