| |
| 2002 | ||
|---|---|---|
| 1 | EE | Shambhu J. Upadhyaya, Jae Min Lee, Padmanabhan Nair: Time Slot Specification Based Approach to Analog Fault Diagnosis Using Built-in Current Sensors and Test Point Insertion. Asian Test Symposium 2002: 429-434 |
| 1 | Padmanabhan Nair | [1] |
| 2 | Shambhu J. Upadhyaya | [1] |