Hyo S. Lee
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2006
1
EE
Dong-Jun Lee
, Hyo S. Lee: Major factors to the solder joint strength of ENIG layer in FC BGA package.
Microelectronics Reliability 46
(7): 1119-1127 (2006)
Coauthor
Index
1
Dong-Jun Lee
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
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