Helmut Lang
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2000
1
Helmut Lang,
Jens Pfeiffer
,
Jeff Maguire
: Using on-chip test pattern compression for full scan SoC designs.
ITC 2000
: 638-643
Coauthor
Index
1
Jeff Maguire
[
1
]
2
Jens Pfeiffer
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
