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2007 | ||
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1 | EE | Stephan Schoenfelder, Matthias Ebert, Christof Landesberger, Karlheinz Bock, Jörg Bagdahn: Investigations of the influence of dicing techniques on the strength properties of thin silicon. Microelectronics Reliability 47(2-3): 168-178 (2007) |
1 | Jörg Bagdahn | [1] |
2 | Karlheinz Bock | [1] |
3 | Matthias Ebert | [1] |
4 | Stephan Schoenfelder | [1] |