Nathalie Labat
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2003
1
EE
Nathalie Labat,
André Touboul
: Editorial.
Microelectronics Reliability 43
(9-11): 1351-1352 (2003)
Coauthor
Index
1
André Touboul
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
