| |
| 2008 | ||
|---|---|---|
| 2 | EE | Duk-Hyung Lee, Dong-Kone Kwak, Kyeong-Sik Min: Comparative Study on Leakage Current of Power-Gated SRAMs for 65-nm, 45-nm, 32-nm Technology Nodes. JCP 3(3): 39-47 (2008) |
| 2007 | ||
| 1 | EE | Duk-Hyung Lee, Dong-Kone Kwak, Kyeong-Sik Min: Comparative Study on SRAMs for Suppressing Both Oxide-Tunneling Leakage and Subthreshold Leakage in Sub-70-nm Leakage Dominant VLSIs. VLSI Design 2007: 632-637 |
| 1 | Duk-Hyung Lee | [1] [2] |
| 2 | Kyeong-Sik Min | [1] [2] |