Tzu-Kun Ku
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2001
1
EE
Bing-Yue Tsui
,
Tsung-Ju Yang
, Tzu-Kun Ku: Impact of interface nature on deep sub-micron Al-plug resistance.
Microelectronics Reliability 41
(11): 1889-1896 (2001)
Coauthor
Index
1
Bing-Yue Tsui
[
1
]
2
Tsung-Ju Yang
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
