Margrit R. Krug

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2006

2 EE Margrit R. Krug, Marcelo de Souza Moraes, Marcelo Lubaszewski: Using a software testing technique to identify registers for partial scan implementation. SBCCI 2006: 208-213

1 EE Margrit R. Krug, Marcelo Lubaszewski, Marcelo de Souza Moraes: Improving ATPG Gate-Level Fault Coverage by using Test Vectors generated from Behavioral HDL Descriptions. VLSI-SoC 2006: 314-319

2006
2	EE	Margrit R. Krug, Marcelo de Souza Moraes, Marcelo Lubaszewski: Using a software testing technique to identify registers for partial scan implementation. SBCCI 2006: 208-213
1	EE	Margrit R. Krug, Marcelo Lubaszewski, Marcelo de Souza Moraes: Improving ATPG Gate-Level Fault Coverage by using Test Vectors generated from Behavioral HDL Descriptions. VLSI-SoC 2006: 314-319

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