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1997 | ||
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3 | EE | Peter A. Krauss, Andreas Ganz, Kurt Antreich: Distributed Test Pattern Generation for Stuck-At Faults in Sequential Circuits. J. Electronic Testing 11(3): 227-245 (1997) |
1994 | ||
2 | Peter A. Krauss: A Distributed Automatic Test Pattern Generation System. HPCN 1994: 105-110 | |
1993 | ||
1 | Peter A. Krauss, Kurt Antreich: Application of Fault Parallelism to the Automatic Test Pattern Generation for Sequential Circuits. Parallel Computer Architectures 1993: 234-245 |
1 | Kurt Antreich | [1] [3] |
2 | Andreas Ganz | [3] |