2001 | ||
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1 | EE | Tetsuji Kishi, Mitsuyasu Ohta, Takashi Taniguchi, Hiroshi Kadota: A New Inter-Core Built-In-Self-Test Circuits for Tri-State Buffers in the System on a Chip. Asian Test Symposium 2001: 462 |
1 | Hiroshi Kadota | [1] |
2 | Mitsuyasu Ohta | [1] |
3 | Takashi Taniguchi | [1] |