Everett E. King

List of publications from the DBLP Bibliography Server - FAQ

2001

1 EE Everett E. King, Ronald C. Lacoe, Janet Wang-Ratkovic: Influence of the lightly doped drain resistance on the worst-case hot-carrier stress condition for NMOS devices. Microelectronics Reliability 41(5): 649-660 (2001)

2001
1	EE	Everett E. King, Ronald C. Lacoe, Janet Wang-Ratkovic: Influence of the lightly doped drain resistance on the worst-case hot-carrier stress condition for NMOS devices. Microelectronics Reliability 41(5): 649-660 (2001)

Coauthor Index