Rex Kiang
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1992
1
Robert Trahan
, Rex Kiang: An Analysis of the Die Testing Process Using Taguchi Techniques and Circuit Diagnostics.
ITC 1992
: 260-269
Coauthor
Index
1
Robert Trahan
[
1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
