S. Kayano
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1992
1
K. Sawada
, S. Kayano: An Evaluation of I
DDQ
Versus Conventional Testing for CMOS Sea-of-Gate IC's.
ITC 1992
: 158-167
Coauthor
Index
1
K. Sawada
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
