Sammy Kayali

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2005

2 EE Yuan Chen, Qing Wang, Sammy Kayali: A statistical approach to characterizing the reliability of systems utilizing HBT devices. Microelectronics Reliability 45(12): 1869-1874 (2005)

2000

1 EE Sammy Kayali: Reliability Considerations for Advanced Microelectronics. PRDC 2000: 99-102

2005
2	EE	Yuan Chen, Qing Wang, Sammy Kayali: A statistical approach to characterizing the reliability of systems utilizing HBT devices. Microelectronics Reliability 45(12): 1869-1874 (2005)
2000
1	EE	Sammy Kayali: Reliability Considerations for Advanced Microelectronics. PRDC 2000: 99-102

Coauthor Index

1 Yuan Chen [2]

2 Qing Wang [2]