| |
| 2007 | ||
|---|---|---|
| 1 | EE | T. Hattori, H. Nohira, S. Shinagawa, M. Hori, M. Kase, T. Maruizumi: Angle-resolved photoelectron spectroscopy on gate insulators. Microelectronics Reliability 47(1): 20-26 (2007) |
| 1 | T. Hattori | [1] |
| 2 | M. Hori | [1] |
| 3 | T. Maruizumi | [1] |
| 4 | H. Nohira | [1] |
| 5 | S. Shinagawa | [1] |