| |
| 2006 | ||
|---|---|---|
| 1 | EE | O. Breitenstein, F. Altmann, T. Riediger, D. Karg, V. Gottschalk: Lock-in thermal IR imaging using a solid immersion lens. Microelectronics Reliability 46(9-11): 1508-1513 (2006) |
| 1 | F. Altmann | [1] |
| 2 | O. Breitenstein | [1] |
| 3 | V. Gottschalk | [1] |
| 4 | T. Riediger | [1] |