2003 | ||
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1 | EE | Valérie Kaftandjian, Olivier Dupuis, Daniel Babot, Yue Min Zhu: Uncertainty modelling using Dempster-Shafer theory for improving detection of weld defects. Pattern Recognition Letters 24(1-3): 547-564 (2003) |
1 | Daniel Babot | [1] |
2 | Olivier Dupuis | [1] |
3 | Yue Min Zhu | [1] |