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| 2003 | ||
|---|---|---|
| 1 | EE | Valérie Kaftandjian, Olivier Dupuis, Daniel Babot, Yue Min Zhu: Uncertainty modelling using Dempster-Shafer theory for improving detection of weld defects. Pattern Recognition Letters 24(1-3): 547-564 (2003) |
| 1 | Olivier Dupuis | [1] |
| 2 | Valérie Kaftandjian | [1] |
| 3 | Yue Min Zhu | [1] |