Wang Jian-Cao
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1986
1
Wang Jian-Cao,
Wei Dao-Zheng
: A New Testability Measure for Digital Circuits.
ITC 1986
: 506-513
Coauthor
Index
1
Wei Dao-Zheng
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
