Yuan-Ruei Jhang
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2006
1
EE
Shin-Min Chao
,
Du-Ming Tsai
,
Yan-Hsin Tseng
, Yuan-Ruei Jhang: Defect detection in low-contrast glass substrates using anisotropic diffusion.
ICPR (1) 2006
: 654-657
Coauthor
Index
1
Shin-Min Chao
[
1
]
2
Du-Ming Tsai
[
1
]
3
Yan-Hsin Tseng
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
