| |
| 2007 | ||
|---|---|---|
| 3 | EE | Min-Hsiung Hsieh, Shuen-Lin Jeng: Accelerated Discrete Degradation Models for Leakage Current of Ultra-Thin Gate Oxides. IEEE Transactions on Reliability 56(3): 369-380 (2007) |
| 2 | EE | Shuen-Lin Jeng, Jye-Chyi Lu, Kaibo Wang: A Review of Reliability Research on Nanotechnology. IEEE Transactions on Reliability 56(3): 401-410 (2007) |
| 2005 | ||
| 1 | EE | Wen-Kui Chang, Shuen-Lin Jeng: Impartial evaluation in software reliability practice. Journal of Systems and Software 76(2): 99-110 (2005) |
| 1 | Wen-Kui Chang | [1] |
| 2 | Min-Hsiung Hsieh | [3] |
| 3 | Jye-Chyi Lu | [2] |
| 4 | Kaibo Wang | [2] |