Min-Hsiung Hsieh

List of publications from the DBLP Bibliography Server - FAQ

2007

1 EE Min-Hsiung Hsieh, Shuen-Lin Jeng: Accelerated Discrete Degradation Models for Leakage Current of Ultra-Thin Gate Oxides. IEEE Transactions on Reliability 56(3): 369-380 (2007)

2007
1	EE	Min-Hsiung Hsieh, Shuen-Lin Jeng: Accelerated Discrete Degradation Models for Leakage Current of Ultra-Thin Gate Oxides. IEEE Transactions on Reliability 56(3): 369-380 (2007)

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