P. Jacob
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2006
1
EE
P. Jacob,
A. Kunz
,
G. Nicoletti
: Reliability and wearout characterisation of LEDs.
Microelectronics Reliability 46
(9-11): 1711-1714 (2006)
Coauthor
Index
1
A. Kunz
[
1
]
2
G. Nicoletti
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
