Shigeru Ito
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2007
1
EE
Satoshi Tayu
, Shigeru Ito,
Shuichi Ueno
: On the Fault Testing for Reversible Circuits.
ISAAC 2007
: 812-821
Coauthor
Index
1
Satoshi Tayu
[
1
]
2
Shuichi Ueno
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
