Kenji Ishikawa
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1995
1
EE
Takashi Aoki
,
Tomoji Toriyama
, Kenji Ishikawa,
Kennosuke Fukami
: A tool for measuring quality of test pattern for LSIs' functional design.
ASP-DAC 1995
Coauthor
Index
1
Takashi Aoki
[
1
]
2
Kennosuke Fukami
[
1
]
3
Tomoji Toriyama
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
