| |
| 2006 | ||
|---|---|---|
| 2 | EE | Hsin-Chyh Hsu, Ming-Dou Ker: Dummy-Gate Structure to Improve ESD Robustness in a Fully-Salicided 130-nm CMOS Technology without Using Extra Salicide-Blocking Mask. ISQED 2006: 503-506 |
| 2003 | ||
| 1 | EE | Ming-Dou Ker, Hsin-Chyh Hsu, Jeng-Jie Peng: Electrostatic Discharge Implantation to Improve Machine-Model ESD Robustness of Stacked NMOS in Mixed-Voltage I/O Interface Circuits. ISQED 2003: 363-368 |
| 1 | Ming-Dou Ker | [1] [2] |
| 2 | Jeng-Jie Peng | [1] |