De D. Hsu
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1985
1
Earl E. Swartzlander Jr.
,
John A. Eldon
, De D. Hsu: VLSI Testing: A Decade of Experience.
COMPCON 1985
: 392-396
Coauthor
Index
1
John A. Eldon
[
1
]
2
Earl E. Swartzlander Jr.
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
