1992 |
5 | | C. L. (Jim) Chen,
Nandakumar N. Tendolkar,
Arthur J. Sutton,
M. Y. (Ben) Hsiao,
Douglas C. Bossen:
Fault-tolerance design of the IBM Enterprise System/9000 Type 9021 processors.
IBM Journal of Research and Development 36(4): 765-780 (1992) |
1984 |
4 | | Chin-Long Chen,
M. Y. (Ben) Hsiao:
Error-Correcting Codes for Semiconductor Memory Applications: A State-of-the-Art Review.
IBM Journal of Research and Development 28(2): 124-134 (1984) |
3 | | Douglas C. Bossen,
Chin-Long Chen,
M. Y. (Ben) Hsiao:
Fault Alignment Exclusion for Memory Using Address Permutation.
IBM Journal of Research and Development 28(2): 170-176 (1984) |
1982 |
2 | | Douglas C. Bossen,
M. Y. (Ben) Hsiao:
Model for Transient and Permanent Error-Detection and Fault-Isolation Coverage.
IBM Journal of Research and Development 26(1): 67-77 (1982) |
1981 |
1 | | M. Y. (Ben) Hsiao,
William C. Carter,
James W. Thomas,
William R. Stringfellow:
Reliability, Availability, and Serviceability of IBM Computer Systems: A Quarter Century of Progress.
IBM Journal of Research and Development 25(5): 453-465 (1981) |