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2006 | ||
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2 | EE | T. H. Lin, W. P. Shih, W. C. Chen, W. Y. Ho: 3D face authentication by mutual coupled 3D and 2D feature extraction. ACM Southeast Regional Conference 2006: 423-427 |
2001 | ||
1 | EE | W. Y. Ho, C. Surya: Study of light-induced annealing effects in a-Si: H thin films. Microelectronics Reliability 41(6): 913-917 (2001) |
1 | W. C. Chen | [2] |
2 | T. H. Lin | [2] |
3 | W. P. Shih | [2] |
4 | C. Surya | [1] |