| |
| 2005 | ||
|---|---|---|
| 1 | EE | Takayuki Hisaka, Yasuki Aihara, Yoichi Nogami, Hajime Sasaki, Yasushi Uehara, Naohito Yoshida, Kazuo Hayashi: Degradation mechanisms of GaAs PHEMTs in high humidity conditions. Microelectronics Reliability 45(12): 1894-1900 (2005) |
| 1 | Yasuki Aihara | [1] |
| 2 | Kazuo Hayashi | [1] |
| 3 | Yoichi Nogami | [1] |
| 4 | Hajime Sasaki | [1] |
| 5 | Yasushi Uehara | [1] |
| 6 | Naohito Yoshida | [1] |