Takashi Hiroi

2002
2	EE	Takashi Hiroi, Chie Shishido, Masahiro Watanabe: Pattern Alignment Method Based on Consistency Among Local Registration Candidates for LSI Wafer Pattern Inspection. WACV 2002: 257-263
1992
1	EE	Takashi Hiroi, Kazushi Yoshimura, Takanori Ninomiya, Toshimitsu Hamada, Yasuo Nakagawa, Shigeki Mio, Kouichi Karasaki, Hideaki Sasaki: Development of Solder Joint Inspection Method Using Air Stimulation Speckle Vibration Detection Method and Fluorescence Detection Method. MVA 1992: 429-434

Coauthor Index

1	Toshimitsu Hamada	[1]
2	Kouichi Karasaki	[1]
3	Shigeki Mio	[1]
4	Yasuo Nakagawa	[1]
5	Takanori Ninomiya	[1]
6	Hideaki Sasaki	[1]
7	Chie Shishido	[2]
8	Masahiro Watanabe	[2]
9	Kazushi Yoshimura	[1]

Colors in the list of coauthors