| |
| 1997 | ||
|---|---|---|
| 2 | EE | Kazuo Iwama, Kensuke Hino, Hiroyuki Kurokawa, Sunao Sawada: Random benchmark circuits with controlled attributes. ED&TC 1997: 90-97 |
| 1994 | ||
| 1 | EE | Kazuo Iwama, Kensuke Hino: Random Generation of Test Instances for Logic Optimizers. DAC 1994: 430-434 |
| 1 | Kazuo Iwama | [1] [2] |
| 2 | Hiroyuki Kurokawa | [2] |
| 3 | Sunao Sawada | [2] |